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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12220874 B1

PDFFull Text
Date of Patent:
Feb. 11, 2025

Filed:

May. 22, 2023

Enhanced non-destructive testing in directed energy material processing

Applicant:

The Research Foundation for the State University of New York, Binghamton, NY (US);

Inventors:

Scott N. Schiffres, Vestal, NY (US);

Matthias Daeumer, Pleasanton, CA (US);

Jacob C. Simmons, Copeke, NY (US);

Arad Azizi, Karaj, IR;

Assignee:

The Research Foundation for The State University of New York, Binghamton, NY (US);

Attorneys:

Hoffberg & Associates

Steven M. Hoffberg

Primary Examiner:

Sang H Nguyen

Int. Cl.
CPC ...
B29C 64/393 (2017.01); B22F 10/20 (2021.01); B22F 10/38 (2021.01); B29C 64/153 (2017.01); G01N 21/17 (2006.01); G01N 29/04 (2006.01); G01N 29/24 (2006.01); G01N 29/34 (2006.01); G01N 29/44 (2006.01); G01N 29/46 (2006.01); G06N 20/00 (2019.01); B22F 10/25 (2021.01); B22F 10/28 (2021.01); B22F 10/30 (2021.01); B22F 10/36 (2021.01); B22F 10/37 (2021.01); B22F 10/50 (2021.01); B22F 10/73 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2015.01); B33Y 50/02 (2015.01); G01N 25/18 (2006.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B22F 10/20 (2021.01); B22F 10/38 (2021.01); B29C 64/153 (2017.08); G01N 21/1717 (2013.01); G01N 29/041 (2013.01); G01N 29/2418 (2013.01); G01N 29/346 (2013.01); G01N 29/4409 (2013.01); G01N 29/46 (2013.01); G06N 20/00 (2019.01); B22F 10/25 (2021.01); B22F 10/28 (2021.01); B22F 10/30 (2021.01); B22F 10/36 (2021.01); B22F 10/37 (2021.01); B22F 10/50 (2021.01); B22F 10/73 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2014.12); B33Y 50/02 (2014.12); G01N 2021/1731 (2013.01); G01N 25/18 (2013.01);
Abstract

A system and method for measuring characteristics, comprising: a directed energy source having an energy output which changes over time, incident on an object undergoing additive manufacturing; a sensor configured to measure a dynamic thermal response of at least a portion of the object undergoing additive manufacturing proximate to a directed location of the directed energy source over time with respect distance from the directed location; and at least one processor, configured to analyze the measured dynamic thermal response to determine presence of a manufacturing defect in the object undergoing additive manufacturing, before completion of manufacturing.

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