The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Oct. 19, 2021
Divergent Technologies, Inc., Los Angeles, CA (US);
Keith McKay, Los Angeles, CA (US);
Richard Kingston, Los Angeles, CA (US);
Lukas Czinger, Los Angeles, CA (US);
Jakub Preis, Los Angeles, CA (US);
Sam Miller, Los Angeles, CA (US);
Aron Derecichei, Los Angeles, CA (US);
Eric Monteith, Los Angeles, CA (US);
DIVERGENT TECHNOLOGIES, INC., Los Angeles, CA (US);
Abstract
Aspects for implementing 3-D printed metrology feature geometries and detection are disclosed. The apparatus may a measurement device for a 3-D printed component. The component may include a plurality of printed-in metrology features arranged at different feature locations on a surface of the component. The measurement device can be configured to detect the feature locations of the printed-in metrology features and to determine a position or an orientation of the component based on the detected feature locations. In various embodiments, the metrology feature may be a protruding or recessed spherical portion, with the corresponding feature location at the center of the sphere.