The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

Nov. 20, 2019
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Kokoro Hatanaka, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); G05B 23/02 (2006.01); G06F 16/2458 (2019.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
B25J 9/163 (2013.01); G05B 23/024 (2013.01); G06F 16/2474 (2019.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G05B 2219/50391 (2013.01);
Abstract

To facilitate confirmation as to whether or not it is data measured by the same operation upon acquiring measurement data in an industrial machine. A learning data confirmation support devicethat facilitates confirmation of contamination of inappropriate data when learning data including only normal data are acquired in advance, in order to detect an anomaly of an industrial machine using machine learning, includes a data acquisition unitthat acquires measurement data including time-series data representing at least one of a predetermined state quantity or control quantity relating to control when the industrial machine is made to perform a certain operation; and a display control unitthat aligns a plurality of pieces of time-series data acquired by the data acquisition unit in a direction of a time axis and, in this state, superimposes a same type of pieces of data of the time-series data to display in a graph.


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