The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Sep. 27, 2022
Siemens Healthineers Ag, Forchheim, DE;
Mathias Hoernig, Moehrendorf, DE;
Christian Huemmer, Lichtenfels, DE;
SIEMENS HEALTHINEERS AG, Forchheim, DE;
Abstract
A compute-implemented method for determining an abnormal structure in an examination region in conjunction with an X-ray recording of an X-ray system, comprising receiving input data, the input data relating to an X-ray recording data set of the X-ray recording having multiple data channels; applying a trained function to the input data, the trained function being based on a machine learning method and applied to at least two data channels to determine the abnormal structure and generate output data; and providing the output data, the output data including an abnormal structure of the examination region.