The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
May. 11, 2023
Qcify Inc., San Mateo, CA (US);
Raf Peeters, San Mateo, CA (US);
Antoon De Cleen, Diest, BE;
Pieter Ieven, Genk, BE;
Ruben Praets, Leopoldsburg, BE;
Qcify Inc., San Mateo, CA (US);
Abstract
A method includes the steps collecting measurement data of a sample utilizing an adaptable inspection unit or while the sample is in-flight, determining a volume or area of the sample based at least in part on the measurement data, and calculating a weight of the sample based at least in part on the volume or area of the sample. The measurement data includes a captured image that includes a plurality of pixels. The determining of the volume of the sample includes determining the number of pixels in the captured image that display a portion of the sample, or determining the maximum number of consecutive pixels that display a portion of the sample in two or three dimensions.