The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Jun. 12, 2018
Applicants:

Nec Corporation, Tokyo, JP;

B.g. Negev Technologies and Applications Ltd., AT Ben-gurion University, Beer Sheva, IL;

Inventors:

Yoshiyuki Yamada, Tokyo, JP;

Masaki Inokuchi, Tokyo, JP;

Yoshinobu Ohta, Tokyo, JP;

Yuval Elovici, Arugot, IL;

Asaf Shabtai, Hulda, IL;

Ron Bitton, Yehud, IL;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 9/40 (2022.01); H04L 101/695 (2022.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); H04L 63/0236 (2013.01); H04L 63/101 (2013.01); H04L 63/108 (2013.01); H04L 63/1433 (2013.01); H04L 2101/695 (2022.05);
Abstract

An information collection system includes: a side-channel information processing unit that derives load information to estimate an impact on the availability of a target machine for active scanning by using side-channel data; an allow list generation unit that generates an allow list including a scan timing and a scan range in which the availability is not affected, the allow list generation unit generating the allow list based on the load information; and an allow list storage unit that stores the allow list. An active scan of the target machine is executed by referencing the allow list stored in the allow list storage unit to collect asset information of the target machine.


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