The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Aug. 10, 2023
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Haobo Wang, Sunnyvale, CA (US);

Qiuju Diao, Santa Clara, CA (US);

Fan Zhang, Fremont, CA (US);

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/11 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1125 (2013.01); G06F 11/10 (2013.01);
Abstract

Techniques for adjusting log likelihood ratios in a decoder may include determining an assist read (AR) zone based on performing assist reads (AR) of multibit memory cells of a memory. Soft reads of the multibit memory cells may be performed to determine a bin within the AR zone for each bit of the data stored in the memory cells. Each bin is associated with a log likelihood ratio (LLR) value. Error correction decoding on the data stored in the memory cells may be performed followed by collecting statistics on the decoded data for each bin in each AR zone. A hard error percentage may be computed for each AR zone based on the collected statistics, and one or more LLR values may be adjusted based on the hard error percentage.


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