The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
Sep. 27, 2022
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Pil-Seung Heo, Seoul, KR;
Se Whan Na, Seoul, KR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
G09G 5/003 (2013.01); G09G 2300/0465 (2013.01); G09G 2320/0233 (2013.01); G09G 2320/029 (2013.01);
Abstract
A mura inspection device may include; an optical meter configured to measure luminance of a display region and generate a first luminance matrix, a luminance preprocessor configured to detect a distortion region of the display region in relation to the first luminance matrix, and generate a second luminance matrix by adjusting luminance of the distortion region, a mura generator configured to generate a mura matrix in relation to a difference between the second luminance matrix and a reference value, and an encoder configured to generate encoding data by applying dimensionality reduction to the mura matrix.