The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
Dec. 01, 2020
Method for inspecting labeling on bounding box by using deep learning model and apparatus using same
Select Star, Inc., Daejeon, KR;
Se Yeob Kim, Seoul, KR;
SELECT STAR, INC., Daejeon, KR;
Abstract
According to the present invention, proposed is a method for inspecting a labeling operation, the method comprising, when a deep learning model for inspecting a labeling operation for a bounding box corresponding to an object included in an image is present and a computing apparatus uses the deep learning model, the steps of: performing, by the computing apparatus, first training on the deep learning model on the basis of a training image; obtaining, by the computing apparatus, an operation image and a bounding box labeling value therefor; calculating, by the computing apparatus, a score for inspection by performing a calculation while passing the operation image and the bounding box labeling value through the deep learning model; and determining, by the computing apparatus, whether the bounding box labeling value for the operation image is accurate on the basis of the score for inspection and performing any one of a pass process, a fail process, and a re-inspection process.