The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Jun. 27, 2019
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Junichi Kosaka, Tokyo, JP;

Daisuke Inaishi, Tokyo, JP;

Yuma Hirai, Tokyo, JP;

Hiroaki Arai, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 20/20 (2019.01); G06V 10/774 (2022.01);
U.S. Cl.
CPC ...
G06V 10/774 (2022.01); G06N 20/20 (2019.01); G06T 7/0002 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30168 (2013.01);
Abstract

In a learning device, a first learning unit performs first machine learning using first training data including a first evaluation result for an evaluation target image to generate a first learned model outputting a second evaluation result for an input image, an evaluation unit uses the first learned model to acquire a plurality of the second evaluation results for a plurality of the input images, a generation unit selects a second image quality parameter from a plurality of first image quality parameters having different values, based on the plurality of the second evaluation results and generates second training data including the selected second image quality parameter, and a second learning unit performs second machine learning using the second training data to generate a second learned model outputting a third image quality parameter used for processing a processing target image.


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