The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Oct. 24, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Azusa Sawada, Tokyo, JP;

Soma Shiraishi, Tokyo, JP;

Takashi Shibata, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/772 (2022.01); G06F 16/55 (2019.01); G06V 10/77 (2022.01); G06V 10/774 (2022.01); G06V 10/778 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/7715 (2022.01); G06F 16/55 (2019.01); G06V 10/772 (2022.01); G06V 10/774 (2022.01); G06V 10/778 (2022.01); G06V 10/82 (2022.01);
Abstract

The learning device includes a metric space learning unit and a case example storage unit. The metric space learning unit learns a metric space including feature vectors extracted from attributed image data, for each combination of different attributes, using the attributed image data to which attribute information is assigned. The case example storage unit computes the feature vector from the image data for case example to store the computed feature vector as a case example associated with the metric space, and stores additional information associated with the case example.


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