The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Aug. 28, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yoshimasa Ono, Tokyo, JP;

Akira Tsuji, Tokyo, JP;

Junichi Abe, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/762 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06V 10/764 (2022.01); G06V 10/762 (2022.01);
Abstract

A processing apparatus () includes classification means () for classifying three-dimensional point group data acquired based on a reflected light from a structure to be inspected illuminated by light into clusters, which are units of a shape that corresponds to the structure to be inspected, based on positional information at each point of the data; and cluster association means () for determining whether a first cluster and a second cluster included in the classified clusters correspond to one structure to be inspected based on a positional relation between the classified clusters.


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