The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
Jan. 11, 2024
Tp-link Corporation Pte. Ltd., Singapore, SG;
Haoran Yang, Chengdu, CN;
TP-LINK CORPORATION PTE. LTD., Singapore, SG;
Abstract
The invention provides a camera extrinsic parameter calibration method, an image stitching method and an apparatus thereof. The calibration method can include: acquiring a plurality of images captured by the camera based on a plurality of sets of extrinsic parameters to be calibrated, wherein each of the plurality of sets of extrinsic parameters to be calibrated include a horizontal rotation angle and a vertical rotation angle; obtaining at least one matched image pair based on feature point matching among the plurality of images, wherein each matched image pair includes matched feature point pairs with a quantity satisfying a threshold condition; and calibrating the plurality of sets of extrinsic parameters to be calibrated according to a first difference representation between coordinate representations of each matched feature point pair of each matched image pair in a reference coordinate system.