The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Jan. 08, 2021
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Maharaj Mukherjee, Poughkeepsie, NY (US);

Utkarsh Raj, Charlotte, NC (US);

Assignee:

Bank of America Corporation, Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/214 (2023.01); G06F 18/23 (2023.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06F 18/23 (2023.01); G06F 18/2155 (2023.01); G06N 20/00 (2019.01); G06V 10/751 (2022.01);
Abstract

Aspects of the disclosure relate to evaluating sources of training data for model generation. A computing platform may receive, from one or more data sources, a labelled data set. The computing platform may apply, to the labelled data set, an unsupervised learning algorithm, resulting in a clustered data set. The computing platform may compare, for each data point in the labelled data set, corresponding clustering information and labelling information to identify discrepancies. The computing platform may flag, for data points with identified discrepancies between the clustering information and labelling information, a labelling error. The computing platform may grade, based on the flagged labelling errors, each of the one or more data sources. Using remaining data of the labelled data set, not flagged with labelling errors, the computing platform may train a supervised learning model by weighting the remaining data based on: a corresponding data source and its grade.


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