The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Aug. 19, 2022
Applicant:

Capital One Services, Llc, McLean, VA (US);

Inventors:

Nathan Wolfe, Silver Spring, MD (US);

Purva Shanker, Arlington, VA (US);

Joshua Edwards, Philadelphia, PA (US);

Gang Mei, Ellicott City, MD (US);

Assignee:

Capital One Services, LLC, McLean, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/28 (2019.01); G06N 20/20 (2019.01);
U.S. Cl.
CPC ...
G06F 16/285 (2019.01); G06N 20/20 (2019.01);
Abstract

A method includes obtaining a first dataset associated with a first set of classes and a second dataset associated with a second set of classes, where the first and second datasets share features. The method also includes creating an aggregated dataset having a quality score for the second set of classes that satisfy a first threshold. Creating the aggregated dataset includes determining a first and second set of clusters based on the first and second datasets. The method includes determining a distance based on a record of the first set of clusters and a second record of the second set of clusters in a feature space. The method further includes determining a set of analysis scores based on the distance and generating an indication for a set of records associated with the set of analysis scores based on the set of analysis scores satisfying a second threshold.


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