The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
Mar. 17, 2023
Split Software, Inc., Redwood City, CA (US);
Charles Wu, Pittsburgh, PA (US);
Gianpiero Condorelli, London, GB;
Mansi Mohan, San Francisco, CA (US);
Yoneo Arai, San Francisco, CA (US);
Gautham Sudarshan, San Mateo, CA (US);
Abstract
A method and apparatus for configurable application feature experiments is described. The method can include receiving data indicative of a metric to be collected after a feature treatment is deployed to a plurality of configurable applications. The method can also include receiving, from the configurable applications, feature treatment event messages that include metric values associated with the metric. Furthermore, the method can include performing a sequential testing process using the metric values from the event messages to determine when statistical significance has been reached for the metric values satisfying or not satisfying a significance threshold associated with the metric, and using this determination to transmit alerts messages to an application developer system.