The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Jun. 05, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Mahesh Reddy Av, Bangalore, IN;

Avinash Kumar, Patna, IN;

Terry O'Callaghan, Hopkinton, MA (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/14 (2006.01); H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
G06F 11/1464 (2013.01); G06F 11/1453 (2013.01); H04L 63/1433 (2013.01); G06F 2201/84 (2013.01);
Abstract

A vulnerability tagging process helps prioritize backups of datasets in a network by monitoring events that affect containers in the network. The monitored events are processed by an AI-based event analyzer to characterize each event in terms of a potential for destruction or damage to the data by each event. A vulnerability measure is calculated as the product of the number of occurrences of each event based on the severity associated with each event. Once the events are analyzed and the vulnerability scores are calculated, the scores are tagged on each workload. The vulnerability tags can then be utilized by the backup server to modify protection policies and/or prioritize backup schedules for the container workloads.


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