The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Jan. 31, 2023
Applicant:

Nec Platforms, Ltd., Kawasaki, JP;

Inventors:

Ryo Suzuki, Kanagawa, JP;

Ken Tonari, Kanagawa, JP;

Assignee:

NEC Platforms, Ltd., Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0721 (2013.01);
Abstract

A learning unit of an operation management system extracts, according to performance information and event logs of a device to be managed, a first abnormality occurrence period using the performance information, calculates a first TF-IDF vector created using event logs in the first abnormality occurrence period, and stores at least the first TF-IDF vector as a learning model. A recommendation section calculates, using the performance information and event logs newly acquired by the device, a second abnormality occurrence period and a second TF-IDF vector, calculates a first degree of similarity between the first TF-IDF vector in the learning model and the second TF-IDF vector, and outputs recommendation information regarding the calculated second abnormality occurrence period when the first degree of similarity is equal to or less than a predetermined value.


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