The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Oct. 13, 2023
Applicant:

Amo Development, Llc, Irvine, CA (US);

Inventors:

Mohammad Saidur Rahaman, Santa Clara, CA (US);

Hong Fu, Pleasanton, CA (US);

Roger W. Accurso, Corning, CA (US);

Zenon Witowski, Rancho Santa Margarita, CA (US);

Assignee:

AMO Development, LLC, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); A61B 3/13 (2006.01); A61F 9/008 (2006.01); G01J 1/42 (2006.01); G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
G02B 26/0875 (2013.01); A61B 3/13 (2013.01); A61F 9/008 (2013.01); G01J 1/4257 (2013.01); G02B 27/108 (2013.01); A61F 2009/00855 (2013.01); A61F 2009/00897 (2013.01);
Abstract

An ophthalmic laser system uses a non-confocal configuration to determine a laser beam focus position relative to the patient interface (PI) surface. The system includes a light intensity detector with no confocal lens or pinhole between the detector and the objective lens. When the objective focuses the light to a target focus point inside the PI lens at a particular offset from its distal surface, the light signal at the detector peaks. The offset value is determined by fixed system parameters, and can also be empirically determined by directly measuring the PI lens surface by observing the effect of plasma formation at the glass surface. During ophthalmic procedures, the laser focus is first scanned insider the PI lens, and the target focus point location is determined from the peak of the detector signal. The known offset value is then added to obtain the location of the PI lens surface.


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