The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Jul. 21, 2021
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

David P. Magee, Allen, TX (US);

Nirmal C. Warke, Saratoga, CA (US);

Stephen Aldridge Shaw, Plano, TX (US);

Terry Alan Bartlett, Dallas, TX (US);

Rick Oden, McKinney, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G01S 7/481 (2006.01); G01S 7/484 (2006.01); G01S 17/10 (2020.01);
U.S. Cl.
CPC ...
G02B 26/0833 (2013.01); G01S 7/4815 (2013.01); G01S 7/4817 (2013.01); G01S 7/484 (2013.01); G01S 17/10 (2013.01);
Abstract

An optical distance measuring system includes a first transmitter, a first solid state device, and a receiver. The first transmitter is configured to generate a first optical waveform. The first solid state device is configured to receive the first optical waveform and steer the first optical waveform toward a target object. The receiver is configured to receive the first optical waveform reflected off of the first target object and determine a distance to the first target object based on a time of flight from the transmitter to the first target object and back to the receiver.


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