The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Jun. 23, 2023
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Eunsol Seo, Yongin-si, KR;

Hyun-Wook Cho, Yongin-si, KR;

Sangkook Kim, Yongin-si, KR;

Taejoon Kim, Yongin-si, KR;

Eungkwan Lee, Yongin-si, KR;

Jaewoo Choi, Yongin-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
G01R 27/2605 (2013.01); G06F 3/04166 (2019.05); G06F 3/0443 (2019.05); G06F 3/0446 (2019.05);
Abstract

In a method for testing an electronic device, the method includes: providing an electronic device including a display layer and a sensor layer on the display layer and configured to operate at a touch drive frequency, the sensor layer including a plurality of first electrodes and a plurality of second electrodes insulatively intersecting the plurality of first electrodes; providing a test signal having a test frequency higher than the touch drive frequency to the plurality of first electrodes; measuring mutual capacitance with the plurality of first electrodes through the plurality of second electrodes; and determining whether or not the sensor layer is defective, based on the mutual capacitance.


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