The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
Jul. 03, 2019
Hitachi High-tech Corporation, Tokyo, JP;
Takaaki Hagiwara, Tokyo, JP;
Teruhiro Yamano, Tokyo, JP;
Kazunori Yamazawa, Tokyo, JP;
Taku Sakazume, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
In a case where plural measurement items that require different incubation times are simultaneously measured in an automatic analyzer, deterioration of the turnaround time of the measurement is minimized. The automatic analyzer receives a request of a sample, obtains a ratio of a short measurement item among examination items of the received analysis request, and a determines an empty cycle based on the ratio of the short measurement item and the number of schedules. When an empty cycle is necessary, the empty cycle is scheduled in a schedule of a sample that is requested to be measured first, for example, an empty cycle in a short measurement for making an incubator empty. As a result, this position can be used for a measurement of a short measurement item such that the wait time of the start of the measurement can be short.