The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Dec. 06, 2021
Applicants:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Ecole Nationale Superieure DE Techniques Avancees, Palaiseau, FR;

Inventors:

Arnaud Recoquillay, Gif-sur-Yvette, FR;

Jean-François Fritsch, Gif-sur-Yvette, FR;

Laurent Bourgeois, Verrieres-le-Buisson, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/06 (2006.01); G01N 29/22 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/0654 (2013.01); G01N 29/221 (2013.01); G01N 29/4472 (2013.01); G01N 2291/015 (2013.01); G01N 2291/0289 (2013.01);
Abstract

A method for imaging a structure composed of at least one wave guide connected to a junction, the structure supporting elastic wave guided propagation modes, the method includes the following steps: for at least one operating frequency, acquiring a plurality of measurements of signals propagating in the structure by means of a plurality of pairs of non-colocalized elastic wave sensors, determining a plurality of propagation modes guided by the structure, correcting the measurements on the basis of ultrasound signals measured or simulated for the same structure in the absence of any defect, converting the measurement matrix M into a wave field scattering matrix U, determining, at each point of a sampling grid, a test vector F characteristic of the structure without any defect, applying a numerical inversion method to determine a vector H of modal components such that U.H=F at each point of a sampling grid, determining an image of the structure on the basis of the vector H.


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