The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Jan. 06, 2022
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Akira Harada, Kyoto, JP;

Kota Ogino, Kyoto, JP;

Hidesato Kumagai, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01);
U.S. Cl.
CPC ...
G01N 27/44791 (2013.01); G01N 27/44743 (2013.01); G01N 27/44782 (2013.01);
Abstract

A sample setting section in which at least one sample to be subjected to electrophoresis analysis and at least one standard sample are set, and a controller. The controller includes a standard data storage memory that stores standard data obtained by performing electrophoresis analysis of a standard sample under a predetermined condition, and a chip determination part configured to perform electrophoresis analysis of the standard sample under the predetermined condition using each of the at least one microchip before electrophoresis analysis of the sample set in the sample setting section is performed to acquire analysis data on the standard sample by the detector, and to perform a chip determination as to whether a state of each of the at least one microchip is suitable for performing electrophoresis analysis by comparing the acquired analysis data with the standard data on the standard sample.


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