The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Jul. 26, 2019
Applicant:

Fuji Corporation, Chiryu, JP;

Inventors:

Tomoya Fujimoto, Nagoya, JP;

Takahiro Kobayashi, Chiryu, JP;

Yuki Inaura, Chiryu, JP;

Assignee:

FUJI CORPORATION, Chiryu, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01); G01N 21/88 (2006.01); H05K 13/08 (2006.01);
U.S. Cl.
CPC ...
G01N 21/95 (2013.01); H05K 13/08 (2013.01); G01N 2021/8845 (2013.01); G01N 2021/8887 (2013.01);
Abstract

An inspection device is such that the inspection device executes a mounting inspection of a component using an inspection image of a board on which the component is mounted and includes an imaging device and an image processing device. The imaging device obtains three monochromatic images of the board in R, G, B. The image processing device sets a board color using brightness values of the three monochromatic images obtained by the imaging device, calculates complementary colors of the board color so set, determines on a color component having a largest brightness value in individual color components of the complementary colors so calculated, and sets the monochromatic image having the color component so determined in the obtained three monochromatic images as the inspection image.


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