The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Apr. 09, 2020
Applicant:

Citex Holding Gmbh, Melle, DE;

Inventor:

Roland Böhm, Altenberge, DE;

Assignee:

CiTEX Holding GmbH, Melle, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 11/06 (2006.01); G01B 11/10 (2006.01); G01B 11/12 (2006.01); G01B 15/02 (2006.01); G01N 21/3581 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3581 (2013.01); G01B 11/028 (2013.01); G01B 11/06 (2013.01); G01B 11/0691 (2013.01); G01B 11/105 (2013.01); G01B 11/12 (2013.01); G01B 15/02 (2013.01);
Abstract

The invention relates to a method for calibrating a THz measuring apparatus (), in particular a pipe, on a measurement object (), comprising at least the following steps: providing a THz measuring apparatus () having a plurality of pivotable THz sensors (), arranged in a circumferential direction around a measuring chamber (), for outputting one THz transmitted beam () each along a sensor axis (B) (provision step); orienting the THz sensors () into a starting position in the measuring chamber () in which the measurement object () is received (orientation step in starting position); allocating the THz sensors () to at least one first and one second sensor group (group formation step); first calibration adjustment step, in which the second sensor group is adjusted as an adjustment group by means of the first sensor group as a starting group, and corresponding second calibration adjustment step, in which the first sensor group is adjusted as an adjustment group by means of the previously calibration-adjusted second sensor group as a starting group; wherein, in each of the calibration adjustment steps=by means of the THz sensors (S, S, S, S) of the starting group, spacing points on a surface () of the measurement object () are determined, =sensor correction angles of the THz sensors (; S, S, S, S) of the adjustment group are determined by means of the spacing points determined by the starting group, and =the THz sensors of the adjustment group are calibration-adjusted about the determined sensor correction angles (a).


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