The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
Dec. 01, 2022
The Regents of the University of Michigan, Ann Arbor, MI (US);
University of Bath, Bath, GB;
Nicholas A. Kotov, Ypsilanti, MI (US);
Ventsislav Valev, Bath, GB;
Lukas Ohnoutek, Zlin, CZ;
Ji-Young Kim, Ann Arbor, MI (US);
The Regents of The University of Michigan, Ann Arbor, MI (US);
University of Bath, Bath, GB;
Abstract
Methods and devices for detecting chiral properties from a sample are provided. Light may be directed towards a sample in contact with a chiral nanoparticle. Third harmonic Mie scattering (THMS) optical activity generated by the chiral nanoparticle in contact with the sample can then be detected. A device for detecting chiral properties of a sample is also contemplated that includes Nat least one microwell having a volume of ≤about 1 microliter configured to hold a chiral nanoparticle capable of generating third harmonic Mie scattering (THMS) optical activity and a sample to be analyzed. The device includes a source of light configured to generate and direct light toward the at least one microwell containing the chiral nanoparticle and the sample and at least one detector configured to detect third harmonic Mie scattering (THMS) generated by the chiral nanoparticle in the microwell.