The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
Feb. 06, 2024
Kuwait University, Safat, KW;
Naser Alsayegh, Bayan, KW;
Nawaf F. Aljuwayhel, Surra, KW;
Hessah Althallab, Granada, KW;
Maryam Jamali, Abdullah Farwaniya, KW;
Hessah H. Alhamdan, Surra, KW;
Ali Alsayegh, Bayan, KW;
KUWAIT UNIVERSITY, Safat, KW;
Abstract
A sample observation container and methods of use thereof are provided. The sample observation container includes a base and one or more sidewalls extending from the base. The one or more sidewalls form a sample enclosure for holding a sample undergoing a sample observation test such as sedimentation photographical capturing and dynamic light scattering, among other tests. The one or more sidewalls form a sample enclosure of adjustable cross-sectional area. The cross-sectional area may be adjusted by feeding or retracting a flexible sheet from a source roll to the sample enclosure. The cross-sectional area may further be adjusted by removing an innermost sidewall from among one or more nested sidewalls. The containers allow for physical adjustment of the cross-sectional area while performing subsequent sample observation tests, thereby allowing assessment of the effects of container size on the results of the sample, such as particles in liquid suspension.