The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Nov. 09, 2020
Applicant:

Horiba, Ltd., Kyoto, JP;

Inventors:

Tetsuji Yamaguchi, Kyoto, JP;

Tetsuya Mori, Kyoto, JP;

Makoto Nagura, Kyoto, JP;

Assignee:

HORIBA, LTD., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2024.01); G01N 15/0205 (2024.01); G01N 21/01 (2006.01); G01N 21/49 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01); G01N 21/01 (2013.01); G01N 21/49 (2013.01); G01N 2021/1704 (2013.01);
Abstract

A particle size distribution measuring apparatus includes a light source that emits measurement light to a sample accommodated in a cell including a pair of light transmission plates separated from each other, one or a plurality of detectors that detects the measurement light scattered in the sample, and a particle size distribution calculator that calculates a particle size distribution of a particle group included in the sample based on output signals of the detectors. The particle size distribution measuring apparatus further includes a force applying mechanism that moves at least one of the light transmission plates to apply pressure or a shearing force to the sample in the cell, in which the particle size distribution calculator is configured to calculate the particle size distribution at the time when the pressure or the shearing force applied to the sample has changed from a first state to a second state.


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