The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Jun. 14, 2022
Applicant:

Khalifa University of Science and Technology, Abu Dhabi, AE;

Inventors:

Baker Mohammad, Abu Dhabi, AE;

Khaled Muneer Mutlaq Humood, Edinburgh, GB;

Maguy Abi Jaoude, Abu Dhabi, AE;

Sueda Saylan, Goztepe, TR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/32 (2006.01); G01M 3/34 (2006.01); H10N 70/00 (2023.01);
U.S. Cl.
CPC ...
G01M 3/3236 (2013.01); G01M 3/34 (2013.01); H10N 70/841 (2023.02); H10N 70/8833 (2023.02);
Abstract

Techniques for measuring vacuum pressure using a memristor element are described. A vacuum sensor can include a memristor element having a semiconductor substrate, a memristive material layer, and a conductive electrode. The off-state resistance of the memristor element can be sensitive to changes in ambient pressure at the element. The off-state resistance of the memristor element may also exhibit a well-defined increase at pressures below a threshold pressure. Measurement of the off-state resistance may be obtained with low power consumption and without changing the resistance or switching the state of the memristor element. The measurements may be used to both determine a leak rate of the ambient pressure within the volume of interest and determine if the sensor is exposed to vacuum pressure below the threshold pressure.


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