The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
Nov. 30, 2023
Sciosense B.v., AE Eindhoven, NL;
Hilco Suy, AE Eindhoven, NL;
Frans De Jong, AE Eindhoven, NL;
Agata Sakic, AE Eindhoven, NL;
Nebojsa Nenadovic, AE Eindhoven, NL;
Geert Calaerts, AE Eindhoven, NL;
Hans Ten Cate, AE Eindhoven, NL;
Renie De Kok, AE Eindhoven, NL;
Andreis Valter, AE Eindhoven, NL;
SCIOSENSE B.V., AE Eindhoven, NL;
Abstract
In an embodiment a method for calibrating temperature sensors includes arranging devices-under-test (DUTs) in a sealable and thermally isolated chamber of a calibration arrangement such that each of the DUTs is in proximity to, associated to and in thermal contact with at least one of a number of reference samples, controlling the calibration arrangement to thermalize the DUTs and the reference samples to a temperature set point and generating, based on a temperature-dependent quantity, a set of measurement signals for each of the DUTs, wherein each set of measurement signals comprises a test measurement signal from a distinct one of the DUTs and a reference measurement signal from each of an associated at least one of the reference samples.