The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Aug. 12, 2022
Applicant:

Hong Kong Applied Science and Technology Research Institute Company Limited, Hong Kong, CN;

Inventors:

Jinbo Jiang, Hong Kong, CN;

Steaphan Si Fan Xie, Hong Kong, CN;

Yong Chi, Hong Kong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G02B 27/09 (2006.01);
U.S. Cl.
CPC ...
G01B 11/25 (2013.01); G02B 27/0955 (2013.01); G02B 27/0988 (2013.01);
Abstract

A line-scanning three-dimensional sensing system measures a surface profile of an object. In the system, a dispersion optical module (DOM) performs a forward optical process of chromatically dispersing a polychromatic linear light beam into constituent narrowband linear light beams (CNLLBs) and focusing the CNLLBs on different focal planes to form a rainbow light pattern for illuminating a scanned surface of the object. The illuminated object displays an information-bearing color image (IBCI) containing height information of the scanned surface. The DOM captures the IBCI, and performs a backward optical process of optically condensing the captured IBCI to form an elongated light pattern. The backward optical process is an inverse of the forward one. A slit spatially filters the elongated light pattern to form an output light line. A height profile of the scanned surface is obtained by analyzing a spectral content at each point of the output light line.


Find Patent Forward Citations

Loading…