The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
Jan. 26, 2022
Applicant:
Fujifilm Business Innovation Corp., Tokyo, JP;
Inventors:
Yuka Zenitani, Kanagawa, JP;
Sakae Takeuchi, Kanagawa, JP;
Koji Sasaki, Kanagawa, JP;
Yoshifumi Eri, Kanagawa, JP;
Mai Mochida, Kanagawa, JP;
Assignee:
FUJIFILM Business Innovation Corp., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C01B 33/18 (2006.01); B82Y 30/00 (2011.01); B82Y 40/00 (2011.01); C01B 33/159 (2006.01);
U.S. Cl.
CPC ...
C01B 33/18 (2013.01); C01B 33/159 (2013.01); B82Y 30/00 (2013.01); B82Y 40/00 (2013.01); C01P 2004/03 (2013.01); C01P 2004/51 (2013.01); C01P 2004/62 (2013.01); C01P 2004/64 (2013.01); C01P 2004/80 (2013.01); C01P 2006/14 (2013.01); C01P 2006/17 (2013.01); C01P 2006/80 (2013.01); C01P 2006/90 (2013.01);
Abstract
Silica particles contain a nitrogen element-containing compound containing a molybdenum element, in which a ratio (Mo/Si) of Net intensity of the molybdenum element to Net intensity of a silicon element measured by X-ray fluorescence analysis is 0.035 or more and 0.35 or less.