The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
Oct. 04, 2018
Italia Technology Alliance S.r.l., Bologna, IT;
Giovanni Puccioni, Capannori, IT;
Francesco Vergentini, Pieve a Nievole, IT;
ITALIA TECHNOLOGY ALLIANCE S.R.L., Bologna, IT;
Abstract
Method for producing logs (B, B) of continuous thin products, or web products, in optimized manner by tracking defects in the surface and/or in the thickness detected on the products, comprising •—a step of continuously winding a thin product (T) into logs (B, B) on a winding machine, in order to produce at least one primary log, •—a step of identifying any defects in the surface and/or the thickness of said continuous thin product, •—a step of storing in a database system (), outside the primary log, information related to said defects comprising at least the position of said defects with respect to a reference system associated with the primary log, •—a step of assigning a primary ID code to said primary log, •—a step of marking said primary log with said primary code, •—a step of associating, in said database system (), information on said defects with the primary ID code of the primary log, so that, in said database, to a given primary ID code information are associated related to defects in the surface and/or the thickness of the respective primary log, that can be identified based on their position on the primary log, •—a step of using said information on the defects of the primary log, stored in the database system (), in order to optimize at least one subsequent processing of the product wound into the respective primary log, said use providing for recognizing the primary code of the primary log being processed and the processing of the product based on the information on the surface defects associated to the primary log.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile