The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
May. 12, 2021
Landa Corporation Ltd., Rehovot, IL;
Boris Levant, Rehovot, IL;
Shai Silberstein, Nes Ziona, IL;
Tomer Yanir, Mazkeret Batya, IL;
Avraham Guttman, Yavne, IL;
Alon Siman Tov, Or Yehuda, IL;
Landa Corporation Ltd., Rehovot, IL;
Abstract
A method includes, receiving a first digital image (FDI) to-be printed by a digital printing system (DPS) (). In a in training phase: for first selected regions () in the FDI, a first set of synthetic images (SIs) (A,B,A,B,A,B) having a defect caused by a defective part (DP) () in the first selected regions, is produced; a neural network (NN) () is trained to detect the defect using the first set SIs. In a subsequent detection phase: the NN is applied for identifying, in a second digital image (SDI) () acquired from an image produced by the DPS, suspected second regions (); for each of the second regions, a second set () of SIs having DPs that form the defects, is produced; and the DP is identified by comparing, in each of the second regions, between the SDI and the second set SIs.