The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
Feb. 13, 2019
Applicant:
Nsk Ltd., Tokyo, JP;
Inventor:
Nobuyuki Hagiwara, Fujisawa, JP;
Assignee:
NSK LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B21J 9/02 (2006.01); B21K 25/00 (2006.01); F16C 19/18 (2006.01); F16C 29/06 (2006.01);
U.S. Cl.
CPC ...
B21J 9/025 (2013.01); B21K 25/00 (2013.01); F16C 19/18 (2013.01); F16C 29/0602 (2013.01);
Abstract
A measuring pressing die () is supported by a spherical concave seat (). A measuring shaft member () is disposed coaxially with a reference axis (α) and is linearly guided in a direction of the reference axis (α) between the measuring pressing die () and a support table (). After that, the load application apparatus measures an actual load in the direction of the reference axis (α) applied to the measuring shaft member () using a load cell () in a state in which the measuring pressing die () is pressed against the measuring shaft member () while the measuring pressing die () is rotated about the reference axis (α).