The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Oct. 14, 2021
Applicant:

Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;

Inventors:

Jun Li, Shanghai, CN;

Wei Zheng, Shanghai, CN;

Longzi Yang, Shanghai, CN;

Shitao Liu, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/03 (2006.01); A61B 6/42 (2024.01); G04F 10/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5205 (2013.01); A61B 6/037 (2013.01); A61B 6/4266 (2013.01); G06T 11/005 (2013.01); G04F 10/005 (2013.01);
Abstract

The present disclosure relates to systems and methods for determining true coincidence events. The systems and methods may determine original coincidence events based on time of occurrence of a plurality of single events. The systems and methods may also determine random coincidence events by processing the plurality of single events based on cycle offsets of detector units that detect the plurality of single events. A difference of any two cycle offsets may be greater than a predetermined coincidence window width. The systems and methods may then determine the true coincidence events based on the original coincidence events and the random coincidence events.


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