The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
Oct. 16, 2023
Applicant:
Varex Imaging Corporation, Salt Lake City, UT (US);
Inventors:
Arundhuti Ganguly, San Jose, CA (US);
Ivan P. Mollov, San Jose, CA (US);
Assignee:
Varex Imaging Corporation, Salt Lake City, UT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/00 (2006.01); A61B 6/00 (2024.01); A61B 6/40 (2024.01); G01T 1/20 (2006.01); G01T 1/34 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4042 (2013.01); A61B 6/4035 (2013.01); A61B 6/482 (2013.01); G01T 1/2006 (2013.01); G01T 1/2014 (2013.01); G01T 1/34 (2013.01);
Abstract
Some embodiments include an x-ray system, comprising: a housing; a plurality of overlapping imaging layers disposed in the housing, each imaging layer configured to generate an image in response to a corresponding incident x-ray beam; and a plurality of x-ray markers attached to the housing and disposed to affect the incident x-ray beam for each of the imaging layers.
Ganguly, Arundhuti. (2025). Multi-maximum x-ray spectrum systems and multi-layer imaging systems (U.S. Patent No. 12213819). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12213819
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile