The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2025
Filed:
Mar. 25, 2020
Nec Corporation, Tokyo, JP;
Shigeru Nakamura, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
The optical interference tomographic imaging device is provided with: a wavelength sweeping laser light source; a branching unit that branches light emitted from the wavelength sweeping laser light source to object light and reference light; an irradiation unit that scans a predetermined range by irradiating different positions on the surface of the measurement target object with the object light outputted from the branching unit; a measurement unit that, after irradiation on the measurement target object, generates information about a change in the interference light intensity ratio between the reference light and the object light scattered from the measurement target object; and a control unit that, on the basis of the information about the change in the interference light intensity ratio generated by the measurement unit, acquires structure data in the depth direction of the measurement target object.