The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Apr. 25, 2021
Applicant:

Adom, Advanced Optical Technologies Ltd., Lod, IL;

Inventors:

Yoel Cohen, Nes Ziona, IL;

Ra'anan Gefen, Modiin-Macabim-Reut, IL;

Yoel Arieli, Jerusalem, IL;

Lee Barnea Nehoshtan, Ramat Hasharon, IL;

Naor Deri, Kiryat Bialik, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/101 (2013.01); A61B 3/0025 (2013.01); A61B 3/0083 (2013.01); A61B 3/0091 (2013.01);
Abstract

Systems and methods for detecting physical characteristics of a multilayered tissue of a subject, such as a tear film including analyzing received detector-output indicative of optical properties of light reflected or deflected from the respective multilayered tissue, to determine spectral properties of the multilayered tissue; and determining physical characteristics of the multilayered tissue by using multiple spectral models of the of the multilayered tissue, each model being associated with spectral properties indicative of different tissue characteristics, wherein physical characteristics of the multilayered tissue are determined by hierarchal determination of a best-fit model from the multiple spectral models.


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