The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

Feb. 27, 2023
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Ping Lu, Cary, NC (US);

Bupesh Pandita, Cary, NC (US);

Minhan Chen, Cary, NC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/085 (2006.01); G04F 10/00 (2006.01); H03L 7/093 (2006.01); H03L 7/099 (2006.01); H03L 7/107 (2006.01);
U.S. Cl.
CPC ...
H03L 7/107 (2013.01); G04F 10/005 (2013.01); H03L 7/085 (2013.01); H03L 7/093 (2013.01); H03L 7/099 (2013.01); H03L 7/1077 (2013.01);
Abstract

In a calibrated phase-locked loop (PLL), a time-to-digital (TDC) converter circuit can be calibrated to a nominal gain by a calibration circuit to achieve a desired jitter response in the PLL. The TDC circuit in the PLL measures a time difference between the reference clock and a feedback signal as a number of time increments, and the calibration circuit adjusts a resolution of the measurement by adjusting the length of the time increments (i.e., resolution). In a Vernier method employed to measure the time difference, the length of a time increment is determined by a delay difference between a first delay of a first delay circuit in a first series of first delay circuits and a second delay of a second delay circuit in a second series of second delay circuits. Adjusting the resolution of the TDC circuit includes adjusting the delay difference between the first delay and the second delay.


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