The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

May. 31, 2022
Applicant:

Mqsemi Ag, Zug, CH;

Inventors:

Munaf Rahimo, Gaensbrunnen, CH;

Iulian Nistor, Niederweningen, CH;

Assignee:

MQSEMI AG, Zug, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/10 (2006.01); H01L 27/07 (2006.01); H01L 29/06 (2006.01); H01L 29/423 (2006.01); H01L 29/739 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 29/1095 (2013.01); H01L 29/0619 (2013.01); H01L 29/0696 (2013.01); H01L 29/42364 (2013.01); H01L 29/7397 (2013.01); H01L 27/0727 (2013.01); H01L 29/7811 (2013.01); H01L 29/7813 (2013.01);
Abstract

A semiconductor device with an active transistor cell comprising a p-doped first and second base layers, surrounding an n type source region, the device further comprising a plurality of first gate electrodes embedded in trench recesses, has additional fortifying p-doped layers embedding the opposite ends of the trench recesses. The additional fortifying layers do not affect the active cell design in terms of cell pitch i.e., the design rules for transistor cell spacing, or hole drainage between the transistor cells, but reduce the gate-collector parasitic capacitance of the semiconductor, hence leading to optimum low conduction and switching losses. To further reduce the gate-collector capacitance, the trench recesses embedding the first gate electrodes can be formed with thicker insulating layers in regions that do not abut the first base layers, so as not to negatively impact the value of the threshold voltage.


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