The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

Feb. 01, 2022
Applicant:

Huawei Cloud Computing Technologies Co., Ltd., Gui'an New District, CN;

Inventors:

Yaoxin Li, Shenzhen, CN;

Changzheng Zhang, Shenzhen, CN;

Xiaoshi Chen, Shenzhen, CN;

Dandan Tu, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/80 (2022.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06T 7/70 (2017.01); G06V 10/50 (2022.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G06V 10/809 (2022.01); G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G06T 7/70 (2017.01); G06V 10/50 (2022.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01); G06T 2207/20021 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30096 (2013.01); G06T 2207/30168 (2013.01); G06V 2201/03 (2022.01);
Abstract

This application relates to the artificial intelligence field, and provides an image processing method, an apparatus, and a system. The image processing method includes: obtaining a plurality of image blocks by segmenting a to-be-analyzed pathological image; inputting the plurality of image blocks to a first analysis model to obtain a first analysis result, where the first analysis model classifies each of the plurality of image blocks based on a quantity or an area of suspicious lesion components; inputting at least one second-type image block in the first analysis result to a second analysis model to obtain a second analysis result, where the second analysis model analyzes a location of a suspicious lesion component of each input second-type image block; and obtaining a final analysis result of the pathological image based on the first analysis result and the second analysis result.


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