The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
Jan. 13, 2022
Applicants:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Inventors:
Assignees:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 3/60 (2024.01); G06T 11/00 (2006.01); G06V 10/40 (2022.01); G06V 10/764 (2022.01); G06V 10/77 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 3/60 (2013.01); G06T 11/00 (2013.01); G06V 10/40 (2022.01); G06V 10/764 (2022.01); G06V 10/7715 (2022.01); G06V 10/7747 (2022.01); G06V 10/82 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract
A processor-implemented method with image analysis includes: receiving a test image; generating a plurality of augmented images by augmenting the test image; determining classification prediction values for the augmented images using a classifier; determining a detection score based on the classification prediction values; and determining whether the test image corresponds to anomaly data based on the detection score and a threshold.