The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
Dec. 16, 2020
Baker Hughes Holdings Llc, Houston, TX (US);
Xiaoqing Ge, Houston, TX (US);
Dustin Michael Sharber, Houston, TX (US);
Jeffrey Potts, Houston, TX (US);
Braden Starcher, Houston, TX (US);
Baker Hughes Holdings LLC, Houston, TX (US);
Abstract
An inspection method includes receiving a plurality of training images and an image of a target object obtained from inspection of the target object. The method further includes generating, by one or more training codes, a plurality of inference codes. The one or more training codes are configured to receive the plurality of training images as input and output the plurality of inference codes. The one or more training codes and the plurality of inference codes includes computer executable instructions. The method further includes selecting one or more inference codes from the plurality inference codes based on a user input and/or one or more characteristics of at least a portion of the received plurality of training images. The method also includes inspecting the received image using the one or more inference codes of the plurality of inference codes.