The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

Feb. 27, 2018
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventor:

Takuma Shibahara, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/084 (2023.01); G06F 17/16 (2006.01); G06F 18/243 (2023.01); G06N 3/045 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06N 3/084 (2013.01); G06F 17/16 (2013.01); G06F 18/24317 (2023.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01);
Abstract

A data analysis apparatus using a first neural network comprises: a setting unit configured to receive output data from the first input layer, set a weight of each layer in the first intermediate layer based on the output data and a second learning parameter, and output said weight to the first output layer; a weight processing unit included in the first output layer, the weight processing unit being configured to weight each output data with the weight of each layer of the first intermediate layer that was set by the setting unit; and a calculation unit included in the first output layer, the calculation unit being configured to calculate prediction data based on each output data that was weighted by the weight processing unit and a third learning parameter.


Find Patent Forward Citations

Shibahara, Takuma. (2025). Data analysis apparatus, data analysis method, and recording medium (U.S. Patent No. 12210975). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12210975

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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