The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
Feb. 09, 2021
Keysight Technologies, Inc., Santa Rosa, CA (US);
Winston Wencheng Liu, Woodland Hills, CA (US);
Razvan Ionut Stan, Agoura Hills, CA (US);
Thomas Ameling, Woodland Hills, CA (US);
KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);
Abstract
One method occurs at an impairment test system. The method includes receiving test configuration information for configuring a testing environment comprising an emulated switching fabric environment implemented using at least one switching application-specific integrated circuit (ASIC), wherein the test configuration information includes testing environment target state information; configuring, using the test configuration information, an impairment test session involving a system under test (SUT) and the emulated switching fabric environment; wherein configuring the impairment test session includes configuring at least one impairment controller for impairing the testing environment during the impairment test session; and initiating the impairment test session, wherein initiating the impairment test session includes generating and sending, using at least one traffic generator, test traffic via the emulated switching fabric environment and effecting at least one impairment of the testing environment during the impairment test session using a feedback control loop and the at least one impairment controller.