The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

Feb. 22, 2022
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Ai Toshikuni, Tokyo, JP;

Tadahisa Kato, Tokyo, JP;

Yasunari Takai, Tokyo, JP;

Yasuto Nishiwaki, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/383 (2019.01); G06F 16/35 (2019.01);
U.S. Cl.
CPC ...
G06F 16/383 (2019.01); G06F 16/35 (2019.01);
Abstract

An input of a data group is received in which tag ID-appended data and time information on time the tag ID-appended data was created are associated; the number of instances is counted of the tag ID-appended data, to which a tag identified by a tag ID has been appended, occurring in each time slice for each tag ID included in the tag ID-appended data and for each time slice obtained by dividing a timeline by a predetermined duration, and the tags are extracted as a few exuberant and useful minority tags in a case where the counted number of instances is greater than a predetermined instance number threshold value and where a ratio of the time slices in which the number of instances does not satisfy a predetermined criterion is greater than a predetermined ratio threshold value; and data in which a score satisfies a predetermined criterion is determined.


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