The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

Sep. 29, 2022
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Karl Eric Anderson, Columbia, MD (US);

Jacob A. Niebloom, Baltimore, MD (US);

Kelly Anne Rooker, Ellicott City, MD (US);

Martin C Stonebraker, Sparks, MD (US);

Nebi Mert Aydin, Odenton, MD (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/2322 (2019.01);
Abstract

An event deduplication system may efficiently perform event deduplication (identifying 'new' or “unique” events that might be an anomaly) by using a first stage that has multiple first stage processes running in parallel (e.g., at different data centers) and a single second stage that has a second stage process that receives and processes events from the different first stage processes. The second stage process updates a global state (e.g., lookup table) and periodically publishes the global state to the first stage processes to update their local state. When the second stage process receives a possible new event from a first stage process, it may more accurately determine whether the event is actually a new event based on the global state.


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