The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
May. 17, 2021
Applicant:
Adp, Inc., Roseland, NJ (US);
Inventors:
Eitan Klein, New York, NY (US);
Mohammed Ahmed, New York, NY (US);
Jonathan Baier, New York, NY (US);
Assignee:
ADP, Inc., Roseland, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/28 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/285 (2019.01); G06N 20/00 (2019.01);
Abstract
A computer-implemented method for managing data quality is provided. The method comprising determining, by a rule engine, a number of critical data points in a number of different software modules. A classifier is identified based on a data type of the critical data points, and the classifier is bound to the critical data points. The classifier scans the critical data points for anomality to verify an ability to correctly process the critical data points. A data quality report is generated based on the scan and displayed to an end user in a graphical user interface.